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1. Scanning electron microscope-based evaluation of eggshell quality Scanning electron (...)

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   by Kristen Ewell; Birendra Mishra; Prem Lal Mahato; Tina Weatherby and Rajesh Jha

   Poultry Science, Volume 103, Issue 3, p. 103428

   Journal Article : Full Text Online

2. New Insight in Understanding Oxygen Reduction and Evolution in Solid-State Lithium–Oxygen (...)

   http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwhV1LixQxEC5WvSjim3V8DPFx8NJu59HpDCwLMsyg4gN3XMRTk046TMNs77IzLXrzP_gn_F3-EitJzwt29dKHpgqSVCX5Kql8BfC80irnlaoQuXGXiIHUiXJphYuhZFbpVOSBdvGLevuVfTpU4-EOPLvgBp_RvWaWBdzdXoIrTOLu6fHPcLJm1uWhDCvOXIyDBkos6YM2Vf3WY-ZbW8_1Uz3HUXCxfMUF-JJ1-8z4JnxYvtYJSdYvY5JJPG7Yyr7eoHH8V2duwY0OcZJX0UVuw07V3IFrGzyEd-E3LnXkTTP3gTqpG3K0-eKFfPz-A72MHHqSV29Ggv_J6Fvns15-cjKrbRJwK3lXL6Z1e_zn569OLzJ4YkBOQnoCageVetGS0fqVHbZwf3owMbGEEhl11XnIe58wGJ7O7O9ND-7B0Xj0efg66Uo4JFpQukgq6j1BD7i0-FE8dc4pihAuQ1NxlzHnUukynptSMWMyIbSwNLdO5zajVvP7QLQ0uSoNhlraCaeYLhGEspRZw0tbUtGDPhq36ObevAjX6owWq7HuwYul3QvTMZ_7Ahyz80SfrkRPI93HeUL9LedZSWL0KTMuZQ-eLL2pwNnqr2B0U5202LYM4bUvQaB6sBvdbK0tBrlH0w_-15-HcBVhm_An25Q_gsuLs7Z6HItZ9MPc-AuRawy0

   by Chen, Chun; Hu, Yong-Sheng; Wang, Jiaping; Xiao, Dongdong; Li, Xing; Wu, Yang; Gu, Lin; Zheng, Hao; Li, Hong; Liu, Yali; et al.

   Nano Letters, Volume 14, Issue 8, pp. 4245 - 4249

   Journal Article : Full Text Online

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3. Cathodoluminescence in a Scanning Electron Microscope Operated in Transmission Mode

   http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LSwMxEB58XPTgG6xWycGbrm6S3TSFUpDSIoKKVhG9hGySpV5KsfX_m8nudlvQQ6_7CNnJ7Mwk8818ABdOyxZ30vnIjedR0hY6knnsvDEUzEodJ63QdvFd3n-w5xc56JVFYdMK7V6lJIOlrovdqBBJhPSr1HuxJGqvw2aKiSGvxcPH_jx3kNJATepNM8VtVlqWyvw9xrI7qmPMxbQoL73NYBfUfJ4Itb4uoCbFocMSBrtq5rjqJ-3BThmIkttCc_ZhzY0PYHuhPeEhfGJ5oN-2evuF4HiDRoB8jYkmnVF3aAq2I9IviXTIA2L7QpVL52bUJU8T7NfsLL4RPKLXKDyaI0i_dgRvg_5r7y4quRgiw6mYRSxLuTUuTiWzlsXCUednnArL8bJhQmeYJLXCR3yGUh0b7_d4Snke21xozY-BaGFaMjN-z6TzJJdMZz6aZDGzhmc2o0kDLqu1UJOi14aquyqjqJQXlQqiUu0GNKvlUuV_N1WcUR9SUU55A64qmde3_x_tZLXHT2GL4bIF3G4TNmbfP-6s4JM4D9r4C1Wh2lk

   by Albrecht, Martin; Schulz, Tobias; Lachowski, Artur and Kernke, Robert

   Journal Of Electronic Materials, Volume 54, Issue 7, pp. 5058 - 5065

   Journal Article : Full Text Online

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