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1. A Network Intrusion Detection System with Broadband WO3–x/WO3–x‐Ag/WO3–x Optoelectronic (...)

   http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1NS8MwGA7iSQ9-g9MpOXit3ZK2SWAMymZRYQ5FmZ5K0jQOxDrcDh73EwT_4X6J-Wi77aqn9j0E2jdfz5s87_MCcIFahId6qHhtxZhntlxP6CDMwzQTIZcCBZbtPqK3L-j-gSa9lSx-pw9RH7iZmWHXazPBuZj6S9FQLpXJJNf4BFFqssyNdJNBSMNefY1AiLtWjtqG4NV-rlQbW8hfb76GL1dRqt1mkl3wVn2g5VhfOo6JO21YI19XKo7_-Zc9sFOiURi74bMPNvLiAGyvaBQegkkM7xxVHHbG3ZvCJGnovoT9fGZZXAV0oucdf9yF5lQX6sheu58XEo6GeDH_-fLL52L-Hb9WBhxOZh_LIjxwkL9bmYPPI_CUXD32rr2yTIM3QRiHHkWC6hU_VNpQkhKmIiKJDBjS0RhRigZG4YVLzlkkNWLIJMMy4wKzUAiFJT4GkJJMIdbiQZBpzEAERSSjuY5lMGEkjEgDNKv-SctJNk1N8KTxjQagDYCse9OJk-hInRgzSo1j09qxadxPBrV18pdGp2BLvweWLBY1waZ2en7mCkmc27H3Cy6C3h8

   by Shen, Guozhen; Li, Yang; Yang, Wenhao and Kan, Hao

   Advanced Functional Materials, Volume 34, Issue 23.

   Journal Article : Full Text Online

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2. Unified Deep Learning approach for Efficient Intrusion Detection System using (...)

   http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV09T8MwELUqJhbKl0ShIA-soYnt4ESqKkHbiLIBRYgpyofTFqpQ0TIgFv4D_5Bfwl1sIzqgSjAmsaOkd7l75z6_I-SYuTLxwVUcrwhDB1Ouk0IR5vAgS_0kT5mo2O53weU9u7oOom6NdO1eGKRVmtivY3oVrc2Zlvk1W7PJpHUD4AD81UcFLJcDzIc4DGgCPTvqnX9HY8aqNT4c7OBou32u4ng9lk_zVxTtZh6cgnqN_ZaefgZqZrJPVCelfe6Ken2iqSd6EWKJk23FHf_5iptkw-BUeqbHbZGaKrdJ3faAoCYk7JA3AK0FwFjaU2pGjVrriFqpcgqYmPYrmQrIbrQ97gxK3OYB3gAzFhUPrKRaNr3dGnco8vBHdGBFLHKKPZPhG_l8_xhqFa0pRdj68qzmu-Q26g-7F45p6OBknIsFFL2Cp4r7GYAoJaDSE7yAV8wVg5DrJjkrPK7SHP9rTQpW8CTkKgxygVwd7kEtvUdoILOChW4iRAboQqYBk1mgoOrhMpT-qWwQbg0YZ0bmHLttTGPLZ3uItdljNHuszd4gzvesmZb5WDFeWt-Il2wZQyZaMbNpXSk24QKuA25FLOqK_T_f-ICs4xGud3uySdbAmOpQt7g4qj6JL4NtFaU

   by Santhi, P and Rajesh Kanna, P

   Knowledge Based Systems, Volume 226, p. 107132

   Journal Article : Full Text Online

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3. EAACK-A Secure Intrusion-Detection System for MANETs

   http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1dS8MwFL1sPumDXxOcTqngi2C2Nm2WBMagzg6nKCiT4VNp2pQ9yCZs-__epB84EPGtpGlpc5Lce5KTewGuqcsThl2FeLmUxJhcopCEEV-kiiWZooFVu8_E4wd9fRPjUQNu67MwWmsrPtNdc2n38rNlujFLZb2-J5DL-U1ocukWZ7XqHYOAFdkKqIkYi6Sv2pJ0ZW86iYyGi3ZxdBr-sWWCbE6V7YnYL63L-ABm1XdZaXW3kJYUiwxbmusqeON_f-EQ9kuH0wmLHnIEDb04hr0fYQhbcBeF4eiJhI5dfNfOYD6cLMxhDMRs0JsPCRbc67UVbS2cIsa5KXfQ4XWew5doujqB93E0HT2QMrcCSZESrknmcuXJgGqGHmLi5oliCCfzcR7OqJf5OcKUp4FmSkn00QKNnrhQOeWMS8XR3J2CI3iaU-kmQZCioedKUJ4KjQTE55KzPm9Dr2rnOC0jjpvEF5-xZR6ujBGZ2CATl8i04aZ-4quItvFH3ZZp3rpe2bJt6FRQxuVwXBma4wv0jKjXhqv6Ng4kszuSLPRyg3X6HL2fAAnW2e9vPoddanNhGAFaB3YQB31R5JC4tH3xG7S82P0

   by Shakshuki, E. M.; Nan Kang and Sheltami, T. R.

   Ieee Transactions On Industrial Electronics (1982), Volume 60, Issue 3, pp. 1089 - 1098

   Journal Article : Full Text Online

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