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    1. Dual-comb spectroscopic ellipsometry

      http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnR3ZattAcEhSCn0pvWjVpsaFvqWKrNUxuxACjRuTFlrc0NLjRewZG3zh2A_--8yuJBP3euiL0LGShjl2ZnbnAHgtTVYqZGWs0Jg41zmLhUDrm5kpo5gyQvh852_8ww_2-ZIP-ntQtLkwIWhfq_HxbDI9no1HIbZyMdVJGyeWDD_2SUuXZNck-7BPDswtFz1Mv5kgryVvEmR6GU-u8zAd-PnYV7cR8caXACZFTdqN7-ijULb_T7bm7yGTv-ybBnU0eAD3Gzuy-7aG9yHs2dkjuFt3ltw8hqN3azmJiZtUN-RS-pqV88VYd09GpzYs_8-ndrXcnCSj0yfwdXD-pX8RN30RYk3mwiouSKvolCFpbo3cWMxdobjJELntydQxprVyHF2eYlpYrYTVVriS55JbhVn2DLpSkvuoHJOCpbnxDThKprnwK0L0MZQRpC1aKt1UC_dNKyZV2LXOeFVjtSKsVgGr1SaCo-07i7pWxj9Hn3lsb0f6Otfhxnx5VTXUrtBpUzDrbKkxL8uetFJlLkV0rqe5NBEctrSqGuG7rlJBTis5TiWL4NX2MYmN3wuRMztfhzFphuRPYQRPa9JuIWlZIwLcIfoOqLtPiFNDae6GMyN407LHLbD-iorn__2jF3CPBb4WNN0dwsFqubYv674WHRKO79iBO2fnn4aXnbDYQFcX_feDnx0f4jqk47Dw5yQ-N1QZFvg

      by Kaneoka, Yoshiki; Yamamoto, Hirotsugu; Minamikawa, Takeo; Hsieh, Yi-Da; Okubo, Sho; Hase, Eiji; Inaba, Hajime; Yasui, Takeshi; Mizutani, Yasuhiro; Iwata, Tetsuo; et al.

      Nature Communications, Volume 8, Issue 1, p. 610

      Journal Article : Full Text Online

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    2. Machine learning powered ellipsometry

      http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1baxQxFA6tIPgi9YKO1jKCb3Y6m5PJJAOloIuLCAUVRXwKuU23pXthd_vQf29OJjM6eHnwZR822d3syQnnO5PvnI-QV9qx2gioCyOcKypbQdE0wqOYmXEGjGsarHf-Jj98h0-f5Wy6R3hfCxNJ-9ZcniyvFyfLy3nkVq4Xtux5YuXH86loeEDCvNwn-yGBGafo2EA9oPjBCTlIVIAcYixHQqVMOcdVR62jkyikBwFuFCG88lRcE76r3FbYkq9AIgM6OxQoHceYwEjMRrEstvz_E079nW75650rpFA2OyD3EwbN33T_9QHZ88uH5G7kgtrtI3J8HgmWPk-KEhf5GqXUvMtP52c-3h2sFn63uT0t52ePydfZuy_T90USVShsAGe7goKeaI3SNF4Yzltaa4QYlQEdXmzDpBETS8MgONFi6an3wppKVy2WnwN7SnKtQ-5pWtAN0MqhekcNVjb4OKnlRuiM0N4uyqZW46h4ca3ilTeTqjOrCmZV0axqkpHXw2fWXaONf85-i-YeZmKT7PjGanOhkqsoz73kbc2sbl1FfW2orqkxk8rptrWSZ-Sw3yyVTu5WBUgYUDBwyTLychgOZw4vUvTSr27iHAohE-SQkSfd3g4r6X0jI2K066OljkeCm8e-3smtM3Lc-8fPZf3dFM_--4eek3sQHZsFrzgkd3abG_-iE8U4is8mjuLJ-gE6Fhvb

      by Liu, Jinchao; Xu, Jingjun; Ren, Mengxin; Yu, Dianqiang and Zhang, Di

      Light, Science & Applications, Volume 10, Issue 1, p. 55

      Journal Article : Full Text Online

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    3. Broadband femtosecond spectroscopic ellipsometry

      http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1bS9xAFD6oL9UHrVVq2lViFbEPUTO5TAZEEHURH6QVtfRpmJkzwQV3s-yl0H_vXJK4Uis-54Qkc-ZkzvX7AHYFJrmkJI8kRYxSlZKIMaotmZlESSQyZuedfxVXv8nPm6J7Ngc7_6ng58mhy3mYOIXNwzwtmBvR-vH8s81iT4qXpJHlzWjAg2ZvfHnk_ONHLsEHc9r4wvcsYGhSHzLdFbhuRnVch_WB7zDxuYYXrdczGI5vfclHWK7dzfDU749VmNODT7BaG_Q43K9Rp7-vATUBuUApBhiWuj-pxjZSxtBNYlrEy2rYU-Hxw4l2xYOqryejv8eHDyfrcNe9uD27jGpWhUgZZ2kSFSjiWKY6VTSTuTpKdYyMllRphlpKlaGx4VzKLC8LVIppLOLSOInlEUqGiU42IBTCBJ-yJIKROEVL35ETVTCbTyozSUUA-82K82ZpLeXFI3c17zzhGa_XIoBvrejQA2y8JtRp1MZrGxtzYqHuSWY8mAC228vGOmzJQwx0NTUyxh9yAD40gM9e3e1TTHBuU2ppADut_t96hVek_lSjZwk-xDKAPb9_WhEL333euz_lZifwx96UmxDQ6OHLux76FRaJ7aFxPW8dWJiMpnrT01ZsGf-_uN1y1vAEWuMBEg

      by Richter, Steffen; Rebarz, Mateusz; Espinoza, Shirly; Schmidt-Grund, Rüdiger; Andreasson, Jakob and Herrfurth, Oliver

      Review Of Scientific Instruments, Volume 92, Issue 3, p. 13892

      Journal Article : Full Text Online

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    1. Ellipsometry : Principles and Techniques for Materials Characterization

      https://find.library.duke.edu/catalog/DUKE99119536378208501

      edited by Faustino Wahaia.

      Book : View Online

    2. Ellipsometry : proceedings of the third International Conference on Ellipsometry, University (...)

      https://find.library.duke.edu/catalog/DUKE001350110

      guest editors: N. M. Bashara, and R. M. A. Azzam.

      Book

    3. Spectroscopic ellipsometry : practical application to thin film characterization

      https://find.library.duke.edu/catalog/DUKE99119485693608501

      Harland G. Tompkins and James N. Hilfiker.

      Book : View Online

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    1. Spectroscopic ellipsometry of group-III adatom kinetics on III-N semiconductor surfaces.

      https://find.library.duke.edu/catalog/DUKE004165643

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