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1. Feature selective validation (FSV) for validation of computational electromagnetics (...)

   http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3Nb9MwFH_adoIDDIZEGJt84LBKpHViJ7aladJUtWJIOwADxCmyHXtDgrZa1_-BP5tnO0k3gRA5RFHiOB_v2X7fP4A3XOmyLj2qJSqYbirGc9k6mjvRcu8Yt6yOycny_bfyw0c5n-7A2yEXxjkXg8_cOBxGX367tJtgKpsUtcBN7cKuUDTlag0eA16VyZtc4ABmoupdklRNrmaX0-R2kMiNsRjldgmKmCohIlKv8af4hGbxx8QcV5v5U_jav2cMtR6nUJNkdHgQg90Xc_zfT9qHJ50ASs4TxzyDHbd4Do_vlSU8gF9BLtzcOrKOIDk4HxLkx-8JfYmczD99GRGUde-fXHpyenNmI0REZ14kHcLOT329CJmSp5ObszU5mc4uR2OyQo4lFxc50UNl0NAHdk1W21SGF_B5Pruavss7xIbc8kLe5WVRS4sKiGe-trgvqClsaahlGtU8VEad5opV2AjFRqmN58qI1jChSlNLxthLIAVrTcWs8IZTzpU1rbGtNwI7EVQLk8Gkp15juzrmAU7jRxP1GaqaQO8Ar1k3id4ZjIY7VqmGxz_aHgQibdsl-mRw_IBBttclFQq5MYPDnmOabhZYN7KuCpTwqioDMlzF4Rt8MnrhlhtsgvIiiuCCv_r7gw_hUTL6hJDD17B3d7txRwm44jgOgN8OvgVz

   by Archambeault, B.; Orlandi, A.; Antonini, G.; Duffy, A.P.; Coleby, D.E. and Connor, S.

   Ieee Transactions On Electromagnetic Compatibility, Volume 48, Issue 3, pp. 460 - 467

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2. Feature selective validation (FSV) for validation of computational electromagnetics (...)

   http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3NT9swFH8CTtthY2PSMgbyYQcqLa0TO7EtISRUtRpIHGDAtFPk-AOQWIso1f79PdtJodI0Lacodj6c92y_7x_AF650WZce1RIVTDcV47m0juZOWO4d44bVMTlZnv4szy_kdLwBX1e5MM65GHzmhuE0-vLt3CyDqWxU1AIPuQmbQtGUq7XyGPCqTN7kAicwE1XvkqRqdDk5Gye3gxTB7be2BUVMlRARqRf4U3xCs1hfmMtut5m-hR_9d8ZQ62EKNUlGh7UY7L6Y4_8OaRvedAIoOU4c8w423Ow9vH5RlnAHfge5cPnoyCKC5OB6SJAf7xL6EjmYfr8eEJR1X16ce3J4e2QiRERnXiQdws4vfTMLmZKHo9ujBTkYT84GQ_KAHEtOcpQ-CT6OJBzrD3A1nVyOv-UdQENuGJdPecuc9ahPCi1abk1pVVvqotAoZXjBUBOrZMmFwXWsMoopTbWW2hoUOZktrPfsI5CC2bZiRviWU86VaW1rrG8FNUxQfG4Go55YjenKlgf0jPsmqi9UNYG8AU2zbhJ5Mxis7nhIJTv-0Xcn0OS5XyJHBvtr_PDcLqlAvVtlsNszSNNN-kUj6yoMmRUZkFUrztbggtEzN19iFxQPg8Rdf_r7i3fhVbLxhAjDz7D19Lh0ewmnYj_y-x_dfv_u

   by Orlandi, A.; Antonini, G.; Duffy, A.P.; Benson, T.M.; Martin, A.J.M. and Woolfson, M.S.

   Ieee Transactions On Electromagnetic Compatibility, Volume 48, Issue 3, pp. 449 - 459

   Journal Article : Full Text Online

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3. Advances in computational electromagnetics: Selected extended papers from the (...)

   http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LSwMxEA5FL3oQX2B9EdCDCqu7STbZlVKopUWEgs-DpyXP6sFabP1B_lMn2V3bggjelrBhIJNkvpnwzYfQMcsl4cRBWpL70k1KWZQZG0dWGOYsZZryQE7Obp7J3X3W7zZQq-bClP0hfgpu_mSE-9ofcKlKFRIAtZ70-jYl5wmEN8h9lgHVC7_LCbut72FAKkF9F-JjEgGOJHVzUpZfzOYuhKPQtX8OpdIqzPTX0VqFD3GndOgGatjRJlqd6xq4hb465bv9BL-OcOulrYMwQ1XUw5WuzZscjjw_sXXx0p5c4ocwbA2ui954LMeA_LCnl2AAgXihNIhnRED8Hox0F4z0fjGCT7q9wSn2Qunb6Knfe-xeR5XSQqQBECURpNeCK5WaxHBNhEwz5QUjnLEAwBTRkubGSkky7jh3cA1o63RsCbN5nJmY0R2EE2pgkhZOsZixXCujtHFKxJqKWArVREf1ShfjspNGEV7AWV54fxTBH0105Z3w84fvfh0G3j-GRXWYYI4F1EecBLgCppgUKZeQ6hLKTEyFbKKz4MI_7BQPg0cSvnb_8_MeWoFlZCUZcR8tTT8-7UGpI3EYdt9hSOq_ASdE30w

   by Emson, Cris

   Iet Science, Measurement & Technology, Volume 18, Issue 9, pp. 453 - 454

   Journal Article : Full Text Online

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