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1. Applying Nyquist's Stability Analysis to Bode Plots With Wrapped Phase Behavior

   http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEF58XPTgG6zWsgfBg6Ru0t1mF0rBVosVEd_VU9gks1QQW9v00H_v7CYRRQRvgTxIZnYz37c78w0hh80wjBHncy9IQ-5xETNPJmGMnAckT5uWN9tq5IG8fAlu72SvWxSru1oYAHDJZ1C3h24vPx0lM7tUhjM8wIAqxSJZDBXLi7W-2JVirhuZlRxDyMjDskKGqZOH7n2_X7eNwusNHHKs6ABTRiHXVuXXv9gFmN46eS5fzWVX1_Psknyd4Ufadanf-O-v2CBrBeikp_ko2SQL8L5FVr9JEW6TJwtHbckTvZ5_zND3R1OKQNSlzs5pKV1CsxFtDdudUQr05m2UTVsnwzYdvGZDOpjo8RhSejPEuEgL2cXJDnnsnT90L7yi54KXBMrPPB-UEmA1frhBtsEbWqcqlYFGmgNhmviGJzJWzBgDAkBwHSPm9JXhTPMAwsYuoVIajcQsNkxoHnNfJYIDEpOm0QISCCrkuDR-NM41NSLHRZiKnKsi66qocFWF7FgbfrsyN1-FVEuHRcW8m0YIXiSeb0qx98dt-2QFn87zNLIqWcomMzjIO0HUyPL5fefsquYG1if7qMrv

   by Roberts, Gordon W. and Yousaf, Saad

   Ieee Transactions On Circuits And Systems. Ii, Express Briefs, Volume 71, Issue 3, p. 1

   Journal Article : Full Text Online

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2. Admittance-Based Stability Analysis: Bode Plots, Nyquist Diagrams or Eigenvalue Analysis?

   http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lb9QwELZKT-0B-pLYtiAfemuz63X8RFURfawqDqiUohUnEzsTFaki0M0e-u_xxEnEShXilEix85qxPZ_9zWdCjpTWPsb5IuOlFpmQnmUmaB8xDxhRKsTNmI08Nx-_8c-3ZnaxRk6GXBgAaMlnMMbTdi2_rMMSp8omlmH0G7HOC21ZytUael2lkq6eMTIzVrI-QYbZyd3N_PZLhIKcjTmKkUzFyiDU7qoSD3VsU6s9Mu-GmdkrMu9fsOVYjxPHJM02rJCvexXH__2WLfKyizzph-Qq22QNfu6Qzb_0CHfJd5TSbRp0hOw8Dm8ljbFoy559or16yTt6en92XpdAbx7qZnE6uT87oZ-efi-jv9DLHwWyvRa0fqRXqPOJWuIw1H2_R77Oru4urrNuC4Ys5Eo1WQQjBddBq0KA0bkAyIEXVlbcQ4x8lLeoNyNwsXJqQPuitFWes4rx4H3pRf6aUGOqIuI0XzFZCC-mNkgBEaeoqpAQgI_ItDeGC50wOe6P8eBagMKsaw3o0ICuM-CIHA91fiVZjn-W3kUDDCW7fz8iB2hzF2MNFMwNyCwKjUsaefHqYe8KrmvXCxfjHSExTU3uP3_PA7KBT06E3kOy3jwu4U3aaOJt67B_ANfe6Fc

   by Miao, Zhixin and Fan, Lingling

   Ieee Transactions On Power Systems, Volume 35, Issue 4, pp. 3312 - 3315

   Journal Article : Full Text Online

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3. Single Coordinate Bode Plots for Stability Evaluation of MIMO Power Electronics Systems (...)

   http://duke.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1bS8MwFA7qkz54HXjnPPgkdOvSdm1hDHS0qDicOlGfStOeuMFYZRdhP8F_7UnSjfkg-NRQGhpycpLz5Vw-xi4avi_Iznctnvuu5XrCtoLMF4R5MHDzhsLNKhv5Nbh7549PQdwuk9V1Lgwi6uAzrKqm9uXnRTZTV2Wk4aqWicoYX_dD2yRrLV0Grqe5jklrPItAhFO6MKlPrdeN7gkKcq9Kp6sfKGLwlUNowarilIdKvMPeFsPREdVVE1Fi7hZ-hVovajb-e-S7bLs0NOHKrIw9toajfba1Un7wgH0_02OI0C4IgQ5GZHVCs9-6LnKE7rCYTpq1fgvIqAWySHUM7RyiZXFwKCR0bjsP0FU8axAt6XQmUFZBh69BCinEYxOtPaf_zFT-7wc1xuVGC7Hm-6mwlzjqtW-skprByji3pxZHFKT7kmQpCKFJGUq0pXQcxZJLe4YvREOmniN56OWhcq7aOel7zjOR5nVE55BBEMiU8JuQtpe6wq2Hmeci4RfVETPkR-xyIaTk05TeSDRkscNESTRREk1KiR6xipr1lQ_NhB__8f6EbaruJpTvlG1MxzM8M4QQ53pd_QBUxc40

   by Amin, Mohammad; Foyen, Sjur; Molinas, Marta; Shah, Chirag Ramgopal; Nilsen, Roy and D'Arco, Salvatore

   Ieee Transactions On Power Electronics, Volume 40, Issue 8, pp. 10481 - 10495

   Journal Article : Full Text Online

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